30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
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30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
Atomic force microscopy - Wikipedia
30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
An ultrafast piezoelectric Z-scanner with a resonance frequency above 1.1 MHz for high-speed atomic force microscopy: Review of Scientific Instruments: Vol 93, No 1
A) A schematic AFM system for FMDPN: (1) piezo tube, (2) substrate,... | Download Scientific Diagram
AFM: The cantilever is moved up and down with the z-piezo. When the AFM... | Download Scientific Diagram
Principles of Operation: AFM/STM — Australia Surface Metrology Lab
Piezoelectric Scanners
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Atomic force microscopy with a 12-electrode piezoelectric tube scanner: Review of Scientific Instruments: Vol 81, No 3
30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners - ScienceDirect
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Atomic force microscopy - LNF Wiki
2: A schematic illustrating the working principle of the atomic force... | Download Scientific Diagram
Atomic force microscopy - About Tribology
Atomic force microscopy with a 12-electrode piezoelectric tube scanner: Review of Scientific Instruments: Vol 81, No 3